物理化学学报 >> 1997, Vol. 13 >> Issue (07): 669-672.doi: 10.3866/PKU.WHXB19970720

研究简报 上一篇    

扫描近场光学显微镜对纳米结构的观察

汤鸣,欧阳敏,蔡生民,薛增泉,刘忠范   

  1. 北京大学化学与分子工程学院智能材料研究中心,北京大学无线电电子学系,北京 100871
  • 收稿日期:1997-01-21 修回日期:1997-04-25 发布日期:1997-07-15
  • 通讯作者: 刘忠范

Observation of Nanometer-sized Structures Using a Scanning Near-field Optical Microscope(SNOM)

Tang Ming,OuYang-Min,Cai Sheng-Min,Xue Zeng-Quan,Liu Zhong-Fan   

  1. College of Chemistry and Molecular Engineering,Peking University,Beijing 100871;Department of Electronics,Peking University,Beijing 100871
  • Received:1997-01-21 Revised:1997-04-25 Published:1997-07-15
  • Contact: Liu Zhong-Fan

关键词: 近场光学, 扫描近场光学显微镜, 纳米粒子

Abstract:

A polydiacetylene nanocrystalline film has been fabricated using surface evaporation method and observed by using Aurora 2000, TopoMetrix scanning near-field optical microscope (SNOM) system. The SNOM images of this film together with the standard testing Al sample indicate that the resolution of the system is better than 80 nm 1/6 of the incident wavelength, 488 nm. The possibility of SNOM data storage using thus fabricated film is also demonstrated.

Key words: Near-field Optics, SNOM, Nanocrystalline