物理化学学报 >> 1998, Vol. 14 >> Issue (07): 590-596.doi: 10.3866/PKU.WHXB19980704

研究论文 上一篇    下一篇

CuO-BaO/SiO2催化剂的结构表征

杨儒, 胡天斗, 刘涛, 相宏伟, 钟炳, 徐耀, 吴东   

  1. 中国科学院山西煤炭化学研究所煤转化国家重点实验室，太原 030001|中国科学院高能物理研究所，北京 100039
  • 收稿日期:1997-09-11 修回日期:1997-12-29 发布日期:1998-07-15
  • 通讯作者: 杨儒

Characterization of CuO-BaO/SiO2 Catalysts Structure

Yang Ru, Hu Tian-Dou, Liu Tao, Xiang Hong-Wei, Zhong Bing, Xu Yao, Wu Dong   

  1. State Key Laboratory of Coal Conversion,Institute of Coal Chemistry,Chinese Academy of Sciences,Taiyuan 030001|Institute of High Energy Physics,Chinese Academy of Sciences,Beijing 100039
  • Received:1997-09-11 Revised:1997-12-29 Published:1998-07-15
  • Contact: Yang Ru

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摘要：

 以XRD、XPS和EXAFS手段对CuO-BaO／SiC2催化剂及其还原态的结构进行了研究．结果表明，在CuO-BaO／SiO2体系中铜和钡都是以氧化态的形式存在，超细SiO2载体对所负载的CuO的结构有影响．随着样品负载量的逐渐降低，Cu-O和Cu-Cu键的键长和配位数逐渐减小，而且低载量样品的键长和配位数减小的幅度最大．在总负载量＞13．39％的样品中，CuO以晶相的形式存在；总负载量≤13．39％的样品中，CUO呈现单层分布的高分出状态．还原态样品中钢以本价铜的形式存在，随负载量的降低，还原态Cu－Cu键的键长和配位数也分别呈现出逐渐减小的趋势．还原态中心铜原子在催化剂表面的分布状态基本上保持了氧化态催化剂中CuO物相的分布状态．

关键词: 氧化铜, 氧化钡, 超细二氧化硅, XRD, XPS, EXAFS

Abstract:

 The structure of CuO-BaO/SiO2 catalysts and their reduced states has been characterized by means of XRD, XPS and EXAFS. Both the results of XRD and XPS indicate that(topper and barium in CuO-BaO/SiO2 exist in CuO and BaO respectively and the SiO2 support has influence on the structure of CuO. The EXAFS results show that the coordination number and length of Cu-O shell and Cu-Cu shell gradually decrease with the supported content decreasing and the extent of decrease is the largest for low supported content samples. When the supported content exceeds 13.39%, CuO in samples is in crystalline state, when the supported content is smaller or equals 13.39%, CuO in samples is in monolayer dispersion state. In the reduced catalyst samples, only metal copper is detected. With the content of CuO in CuO-BaO/SiO2 decreasing, the length and coordination number of Cu-Cu bond of metal copper on reduced catalyst surface also decrease gradually.

Key words: CuO, BaO, XRD, XPS, EXAFS, Ultrafine SiO2