物理化学学报 >> 2002, Vol. 18 >> Issue (04): 359-363.doi: 10.3866/PKU.WHXB20020415

研究简报 上一篇    下一篇

电化学沉积金纳米线结构及其电学特性

刘虹雯;侯士敏;张耿民;申自勇;刘惟敏;吴锦雷;薛增泉;Emmanuel Roy;Kui-Yu Zhang   

  1. 北京大学电子学系,北京 100871;中国科学院物理研究所凝聚态物理中心北京真空物理实验室,北京 100080;汉斯大学物理系,法国
  • 收稿日期:2001-09-12 修回日期:2001-11-14 发布日期:2002-04-15
  • 通讯作者: 侯士敏 E-mail:smhou@ibm320h.phy.pku.edu.cn

Structure and Electrical Properties of Gold Nanowires Grown with Electrochemical Deposition

Liu Hong-Wen;Hou Shi-Min;Zhang Geng-Min;Shen Zi-Yong;Liu Wei-Mim;Wu Jin-Lei;Xue Zeng-Quan;Emmanuel Roy;Kui-Yu Zhang   

  1. Department of Electronics, Peking University, Beijing 100871;Beijing Laboratory of Vacuum Physics, Center for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080;Department of Physics, Reims University, France
  • Received:2001-09-12 Revised:2001-11-14 Published:2002-04-15
  • Contact: Hou Shi-Min E-mail:smhou@ibm320h.phy.pku.edu.cn

摘要: 用电化学沉积方法,在有机介孔模板上制备出直径为90 nm的金纳米线.透射电子显微镜(TEM)分析结果表明,纳米线表面光滑并呈单晶结构.去除有机模板的金纳米线阵列用扫描电子显微镜(SEM)测试,纳米线顶端呈平台状,直径分布均一.我们利用原子力显微镜(AFM)测量了金纳米线阵列的微观结构,得到与SEM相一致的结果.在大气和室温条件下,用导电AFM针尖在接触模式下测量了单根纳米线的轴向I-V特性曲线,其结果为金属性.

关键词: 金纳米线, AFM, I-V特性曲线

Abstract: Gold nanowires with 90 nm diameter were prepared by electrodeposition on polycarbonate membrane template. Transmission electron microscope(TEM)results indicated that the surfaces of nanowires were smooth and exhibited single crystal structure. Scanning electron microscopy showed that these gold nanowires had flat roofs and were distributed uniformly on the substrate. The array microstructure of nanowires determined by atomic force microscope(AFM) was consistent with scanning electron microscope(SEM)results. The I-V characteristics of individual nanowire by AFM revealed metallic characteristics with a conductive tip operating in contact mode at room temperature in air.

Key words: Gold nanowires, AFM, I-V characteristics curve