物理化学学报 >> 2008, Vol. 24 >> Issue (09): 1685-1688.doi: 10.3866/PKU.WHXB20080927

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纳米粒子尺寸效应引起的内层电子结合能位移

赵志娟; 刘芬; 邱丽美; 赵良仲; 闫寿科   

  1. 中国科学院化学研究所, 北京 100190
  • 收稿日期:2007-12-06 修回日期:2008-04-25 发布日期:2008-09-10
  • 通讯作者: 刘芬 E-mail:fenliu@iccas.ac.cn

Core Level Binding Energy Shifts Caused by Size Effect of Nanoparticles

ZHAO Zhi-Juan; LIU Fen; QIU Li-Mei; ZHAO Liang-Zhong; YAN Shou-Ke   

  1. Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, P. R. China
  • Received:2007-12-06 Revised:2008-04-25 Published:2008-09-10
  • Contact: LIU Fen E-mail:fenliu@iccas.ac.cn

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摘要： 用XPS测定了氩离子溅射前后的Pt-PVP纳米粒子和TiO2、ZnO及SiO2纳米粒子的内层电子结合能, 并与其对应的体材料进行了比较. 结果表明, Ar+溅射前Pt-PVP的Pt 4f结合能比体材料Pt的稍低, 但Ar+溅射后由于PVP包覆层被除去, 裸露的Pt 纳米粒子的结合能明显高于Pt体材料. 与非纳米氧化物比较, 纳米氧化物TiO2、ZnO 和SiO2的内层电子结合能也向高结合能方向位移, 其位移大小的顺序为TiO2

关键词: 纳米粒子, 尺寸效应, XPS, 电子结合能, 原子外弛豫

Abstract: XPS spectra were used to determine the binding energies for Pt-PVP nanoparticles before and after Ar+ ion sputtering, as well as for some oxides nanoparticles (TiO2, ZnO, and SiO2). The binding energies of the nanoparticles were compared with those of the corresponding bulk materials. The results showed that, compared with bulk Pt, the Pt 4f binding energy of Pt-PVP nanoparticles before Ar + ion sputtering shifted to lower binding energy side. After Ar+ sputtering, the PVP on Pt nanoparticles was sputtered away and the Pt nanoparticles became bare, the binding energy shifted to higher binding energy side. By comparison with the bulk oxides, the binding energies of TiO2, ZnO, and SiO2 nanoparticles also shifted to the higher binding energy side, and the magnitude of binding energy shift was in the order of TiO2

Key words: Nanoparticles, Size effect, XPS, Electron binding energy, Extra-atomic relaxation

MSC2000: 

  • O647