物理化学学报 >> 2006, Vol. 22 >> Issue (04): 470-474.doi: 10.3866/PKU.WHXB20060416

研究论文 上一篇    下一篇

Fluorescein有机薄膜在Ag(110)面上的生长研究

胡云玩;钱惠琴;陈桥;毛宏颖;宋飞;黄寒;李海洋;何丕模;鲍世宁   

  1. 浙江大学物理系, 杭州 310027; 圣安德鲁斯大学联合化学学院, 英国
  • 收稿日期:2005-10-14 修回日期:2005-12-06 发布日期:2006-04-10
  • 通讯作者: 鲍世宁 E-mail:phybao@dial.zju.edu.cn

The Thin Films Growth of Fluorescein on Ag(110)

HU Yun-Wan;QIAN Hui-Qin;CHEN Qiao;MAO Hong-Ying;SONG Fei;HUANG Han;LI Hai-Yang;HE Pi-Mo;BAO Shi-Ning   

  1. Physics Department, Zhejiang University, Hangzhou 310027, P. R. China; School of Chemistry and Ultrafast Photonics Collaboration, University of St. Andrews, UK
  • Received:2005-10-14 Revised:2005-12-06 Published:2006-04-10
  • Contact: BAO, Shi-Ning E-mail:phybao@dial.zju.edu.cn

PDF

3352

赞

摘要： 利用紫外光电子能谱(UPS)对在Ag(110)表面上荧光素(fluorescein)的生长进行研究. 研究表明, 与fluorescein分子轨道有关的4个特征峰分别位于费米能级以下2.70, 3.80, 7.40和9.80 eV处. 角分辨紫外光电子能谱(ARUPS)测量结果表明, fluorescein分子的三苯环平面平行衬底平面, 分子的C=O轨道轴向接近于[1-10]晶向.

关键词: 有机半导体材料, 紫外光电子能谱, 结构和电子结构

Abstract: The thin films of fluorescein grown on Ag(110) have been studied by the ultraviolet photoemission spectroscopy(UPS). Four emission features are located at 2.70, 3.80, 7.40, and 9.80 eV below the Fermi level, respectively. The angle-resolved ultraviolet photoemission spectroscopy(ARUPS) suggests that the triring plane of fluorescein is parallel to the substrate and the axis of the C=O orbit is close to the [1-10] azimuth.