物理化学学报 >> 2013, Vol. 29 >> Issue (07): 1370-1384.doi: 10.3866/PKU.WHXB201304191

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原子分辨显微分析技术研究进展

袁秉凯1,2, 陈鹏程1, 仉君1, 程志海1, 王琛1, 裘晓辉1   

  1. 1 国家纳米科学中心, 北京 100190;
    2 北京大学前沿交叉学科研究院, 北京 100871
  • 收稿日期:2013-01-14 修回日期:2013-04-17 发布日期:2013-06-14
  • 通讯作者: 王琛, 裘晓辉 E-mail:wangch@nanoctr.cn;xhqiu@nanoctr.cn
  • 基金资助:

    国家重大科学研究计划(2012CB933001)和国家自然科学基金(21173058)资助

Research Progress in Atomic Resolution Microscopy

YUAN Bing-Kai1,2, CHEN Peng-Cheng1, ZHANG Jun1, CHENG Zhi-Hai1, WANG Chen1, QIU Xiao-Hui1   

  1. 1 National Center for Nanoscience and Technology, Beijing 100190, P. R. China;
    2 Academy for Advanced Interdisciplinary Studies, Peking University, Beijing 100871, P. R. China
  • Received:2013-01-14 Revised:2013-04-17 Published:2013-06-14
  • Contact: WANG Chen, QIU Xiao-Hui E-mail:wangch@nanoctr.cn;xhqiu@nanoctr.cn
  • Supported by:

    The project was supported by the National Key Basic Research Program of China (2012CB933001) and National Natural Science Foundation of China (21173058).

摘要:

非接触原子力显微技术(NC-AFM)近年来发展迅速. NC-AFM对单个分子的成像和谱学实现了原子分辨和单个化学键分辨. NC-AFM自身功能的拓展及其与不同探针技术的联用将为材料、物理、化学和生命科学有关的研究提供崭新的思路. 本文首先介绍NC-AFM和qPlus 传感器的基本原理, 然后讨论原子尺度的相互作用力和短程力的精确测量, 总结近年来NC-AFM在原子尺度的化学结构成像、化学识别、电子结构性质分析以及原子操纵技术中的研究进展, 并讨论了开尔文探针力显微技术(KPFM)在局域接触势差(LCPD)测量方面的应用. 最后展望了NC-AFM面临的挑战和发展机遇.

关键词: 扫描探针显微技术, 非接触原子力显微技术, qPlus 传感器, 化学识别, 原子操纵, 电子结构, 开尔文探针力显微技术

Abstract:

Tremendous progress has been made in non-contact atomic force microscopy (NC-AFM) recently. The spatial resolution of NC-AFM imaging and spectroscopy of individual molecules on surfaces has reached true atomic resolution and bond differentiation level. Combination of NC-AFM with other scanning probe techniques can open a new way for materials, physics, chemistry, and biochemistry studies. In this review, we first introduce the basic principle of NC-AFM and qPlus sensor. The interaction force at atomic scale and precise measurement of short-range force are discussed. We summarize the recent advances in structural determination of organic molecules, chemical identification, electronic structure, and atomic manipulation at the atomic scale. In addition, we also discuss the application of Kelvin probe force microscopy (KPFM) in measurement of local contact potential difference (LCPD). Finally, perspectives and challenges in NC-AFM techniques are presented.

Key words: Scanning probe microscopy, Non-contact atomic force microscopy, qPlus sensor, Chemical identification, Atomic manipulation, Electronic structure, Kelvin probe force microscopy

MSC2000: 

  • O647