用正电子湮没寿命谱法研究锡镀层缺陷
姚士冰;刘赞今;周绍民;方江陵
STUDY ON THE STRUCTURE DEFECT OF ELECTRODEPOSITED TIN USING POSITRON ANNIHILATION LIFETIME SPECTROSCOPY
Yao Shi-Bing; Liu Zan-Jin; Zhou Shao-Min; Fang Jiang-Ling
物理化学学报 . 1991, (02): 215 -218 .  DOI: 10.3866/PKU.WHXB19910217