Acta Phys. -Chim. Sin. ›› 2011, Vol. 27 ›› Issue (11): 2613-2617.doi: 10.3866/PKU.WHXB20111117

• ELECTROCHEMISTRY AND NEW ENERGY • Previous Articles     Next Articles

Synthesis of ZnO on ITO and Etched Pattern Characterization by Scanning Electrochemical Microscopy

TANG Jing1, ZHENG Jing-Jing1, XU Wei1, TIAN Xiao-Chun1, LIN Jian-Hang2   

  1. 1. Key Laboratory of Analysis and Detection Technology for Food Safety, Ministry of Education & Fujian Province, College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350108, P. R. China;
    2. Instrumental Measurement and Analysis Center, Fuzhou University, Fuzhou, 350002, P. R. China
  • Received:2011-04-18 Revised:2011-08-01 Published:2011-10-27
  • Contact: TANG Jing
  • Supported by:

    The project was supported by the National Natural Science Foundation of China (20873112, 21073038).

Abstract: We report a direct electrochemical deposition process to produce ZnO nanorods or a ZnO thin film on an indium tin oxide (ITO) substrate. The ZnO film was etched by an agarose stamp containing HCl as the etchant to form different patterns. The structure, morphology, and electrochemical properties of the ZnO thin films on the ITO substrate were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and scanning electrochemical microscopy (SECM).

Key words: ZnO nanorods array, Electrodeposition, Agarose stamp, Scanning electrochemical microscopy


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