Acta Phys. -Chim. Sin. ›› 2013, Vol. 29 ›› Issue (07): 1603-1608.doi: 10.3866/PKU.WHXB201305091


An Electrostatic Force Microscopy Investigation of the Dynamic Properties of Microscopic Interface in Nanocomposites

PENG Jin-Ping1, ZHANG Dong-Dong1, GUAN Li2, ZHANG Hui1, ZHANG Zhong1, QIU Xiao-Hui1   

  1. 1. National Center for Nanoscience and Technology, Beijing 100190, P. R. China;
    2. Renmin University of China, Department of Chemistry, Beijing 100872, P. R. China
  • Received:2013-03-12 Revised:2013-05-09 Published:2013-06-14
  • Contact: ZHANG Zhong, QIU Xiao-Hui;
  • Supported by:

    The project was supported by the National Natural Science Foundation of China (20973046, 11225210) and Ministry of Science and Technology of China (2010DFA54310, 2011DFR50200).


The microscopic structure and properties of the interfacial regions in nanocomposites considerably affect the dielectric properties such as dielectric constant, dielectric loss, and breakdown strength. In this paper, we developed a method based on electrostatic force microscopy (EFM) to characterize the structures and the dynamic dielectric responses of the interfaces in TiO2/epoxy nanocomposites. The nanometer-scale resolution of EFM enabled direct detection of the temperaturedependent dielectric response associated with the molecular dipoles of the epoxy chains at the interface between TiO2 nanoparticles and epoxy matrix. In addition, different interfacial effects were obtained by the surface modification of TiO2 nanoparticles. The EFM images showed that the investigated interfacial regions around the two types of TiO2 nanoparticles exhibited different dielectric loss responses.

Key words: Interfacial effect, Dielectric response, Electrostatic force, Epoxy resin, Nanocomposite


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