Acta Phys. -Chim. Sin. ›› 2016, Vol. 32 ›› Issue (1): 283-289.doi: 10.3866/PKU.WHXB201511132

• ARTICLE • Previous Articles     Next Articles

In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode

Xing-Rui LIU,Hui-Juan YAN,Dong WANG*(),Li-Jun WAN   

  • Received:2015-10-02 Published:2016-01-13
  • Contact: Dong WANG E-mail:wangd@iccas.ac.cn
  • Supported by:
    the Ministry of Science and Technology(2011YQ03012415, 2011CB932302);National Natural Science Foundation of China(21127901, 21573252)

Abstract:

The interfacial morphology of a single crystal Si wafer anode during the first discharging-charging cycle was investigated using in situ atomic force microscopy (AFM). The solid-electrolyte interphase (SEI) began to grow from 1.5 V, developing rapidly between 1.25 and 1.0 V, and slowed down after 0.6 V. The morphology suggested that the SEI had a layered structure. The outer layer of SEI was soft and easy to be scraped off during the AFM tip scanning. The underlayer of SEI had granular features. During the lithiation process, the Si surface became grainy because of the insertion of Li ions. After the first cycle, the Si surface was completely covered by inhomogeneous SEI. The thickness of the SEI was approximately 10–40 nm.

Key words: Si anode, Solid electrolyte interphase, In situ atomic force microscopy

MSC2000: 

  • O646