Acta Phys. -Chim. Sin. ›› 2017, Vol. 33 ›› Issue (2): 419-425.doi: 10.3866/PKU.WHXB201610192

• ARTICLE • Previous Articles     Next Articles

Molecular Beam Epitaxy Growth and Surface Structural Characteristics of PbTe(111) Thin Film

Hai-Fei WU1,*(),Yao CHEN1,Shan-Hu XU1,Yong-Hong YAN1,Jian-Xiao SI2,Yong-Sheng TAN1   

  1. 1 Department of Physics, Shaoxing University, Shaoxing 312000, Zhejiang Province, P. R. China
    2 College of Mathematics, Physics and Information Engineering, Zhejiang Normal University, Jinhua 312004, Zhejiang Province, P. R. China
  • Received:2016-08-09 Published:2017-01-12
  • Contact: Hai-Fei WU
  • Supported by:
    the National Natural Science Foundation of China(51202149,51302248,11575116,61405118)


PbTe thin films were epitaxially grown on BaF2(111) substrate using molecular beam epitaxy (MBE). In situ characterization by reflection high energy electron diffraction (RHEED) revealed a transition of the growth mode from 3D to 2D. Rotational symmetry studies combined with first principles density functional theory (DFT) calculations revealed that under Pb-rich and 350℃ substrate temperature (Tsub) growth conditions, stable (2×1) reconstructions appear on the PbTe(111) surface. When the surface of PbTe(111)-(2×1) was covered with Te, the stable (2×1) reconstructions could be retrieved under 300℃ annealing. This provides an effective method for the protection of PbTe film surfaces from the atmospheric environment.

Key words: Surface reconstruction, DFT, RHEED, Rotational symmetry, PbTe thin film


  • O647