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ISSN 1000-6818CN 11-1892/O6CODEN WHXUEU
Acta Phys Chim Sin >> 2008,Vol.24>> Issue(01)>> 165-170     doi: 10.3866/PKU.WHXB20080130         中文摘要
Electrochemical Behavior of High-Voltage LiNi0.5Mn1.5O4-xFx Electrodes at Elevated Storage Temperature

DU Guo-Dong; NULI Yan-Na; FENG Zhen-Zhen; WANG Jiu-Lin; YANG Jun


School of Chemistry and Chemical Engineering, Shanghai JiaoTong University, Shanghai 200240, P. R. China
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5 V cathode materials LiNi0.5Mn1.5O4-xFx (x=0, 0.1) for lithium ion battery were synthesized via sol-gel method combined with high temperature treatment. The synthesized samples were characterized by X-ray diffractrometry (XRD), scanning electron microscopy (SEM) and specific surface area measurements (BET). Coin cells were assembled using these cathode materials, followed by storage at an elevated temperature (85 ℃) for 24 h, and then a series of electrochemical measurements were conducted to examine the changes of the electrochemical properties before and after cell storage at the elevated temperature. The experimental results showed that the open-circuit voltage of the cell declined quickly during high temperature storage because of self-discharge. The voltage retention was significantly influenced by specific surface area of the powder material and fluorine doping. The larger the specific surface area is, the shorter the voltage retention time becomes. Fluorine doping was favorable for stabilizing the cell voltage at elevated storage temperature and could improve the interfacial property between the electrode and electrolyte. Therefore, the charge and discharge performance was enhanced.

Keywords: Fluorine doping   5 V cathode material   High temperature storage   Secondary lithiumbattery  
Received: 2007-07-02 Accepted: 2007-09-03 Publication Date (Web): 2007-10-09
Corresponding Authors: YANG Jun Email: yangj723@sjtu.edu.cn


Cite this article:

DU Guo-Dong; NULI Yan-Na; FENG Zhen-Zhen; WANG Jiu-Lin; YANG Jun

. Electrochemical Behavior of High-Voltage LiNi0.5Mn1.5O4-xFx Electrodes at Elevated Storage Temperature[J]. Acta Phys. -Chim. Sin., 2008,24 (01): 165-170.    doi: 10.3866/PKU.WHXB20080130
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