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Acta Phys. -Chim. Sin.  2007, Vol. 23 Issue (03): 414-418    DOI: 10.3866/PKU.WHXB20070325
Note     
Low-temperature Preparation and Characterization of TiO2 Thin Films with a Bicrystalline Framework
YAN Shan-Shan;WU Lian-Di;CHEN Feng;ZHANG Jin-Long
(Laboratory for Advanced Materials, Institute of Fine Chemicals, East China University of Science and Technology, Shanghai 200237, P. R. China)
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Abstract  TiO2 thin films were prepared at low-temperature by the sol-gel method. The as-prepared TiO2 sols were characterized with X-ray diffraction (XRD) and transmission electron microscopy (TEM), TiO2 films were characterized with UV-Vis spectra and atomic force microscopy (AFM), respectively. The photocatalytic activity of the thin films was evaluated by the degradation of rhodamine B in aqueous solution under UV irradiation.The results indicated that a bicrystalline framework of anatase and brookite was present in the as-prepared films. And the TiO2 films showed high transmittance and photocatalytic activity. The effect of sol-refluxing temperature on the performance of TiO2 films was investigated. The increase of sol-refluxing temperature led to the improved photocatalytic activity of TiO2 films. This is due to the crystalline perfection of TiO2 sols and average roughness enlargement of TiO2 films. The TiO2 films prepared by the sol refluxed at 100 ℃ showed the highest photocatalytic activity.


Key wordsTiO2 thin film      Low-temperature preparation      Bicrystalline framework      Average roughness      Photocatalytic activity     
Received: 05 September 2006      Published: 07 March 2007
Corresponding Authors: ZHANG Jin-Long     E-mail: jlzhang@ecust.edu.cn
Cite this article:

YAN Shan-Shan;WU Lian-Di;CHEN Feng;ZHANG Jin-Long. Low-temperature Preparation and Characterization of TiO2 Thin Films with a Bicrystalline Framework. Acta Phys. -Chim. Sin., 2007, 23(03): 414-418.

URL:

http://www.whxb.pku.edu.cn/10.3866/PKU.WHXB20070325     OR     http://www.whxb.pku.edu.cn/Y2007/V23/I03/414

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