Acta Phys. -Chim. Sin. ›› 1995, Vol. 11 ›› Issue (02): 118-122.doi: 10.3866/PKU.WHXB19950205

• ARTICLE • Previous Articles     Next Articles

Characterization of Structure of Tetrathia-fulvalene Derivatives/Stearic Acid LB Films

Xiao Yu-Fang, Yao Zhong-Qi, Jin Dao-Sen   

  1. Lanzhou Institute of Chemical Physics,Chinese Academy of Sciences,Lanzhou 730000
  • Received:1993-12-11 Revised:1994-03-03 Published:1995-02-15
  • Contact: Xiao Yu-Fang

Abstract:

Structures of LB films based on tetrabenzylthio-tetrathiafulvalene/stearic acid(TBT-TTF/SA)(1:1)、bis(ethyldithio)tetrathiafulvalene/stearic acid (BEDT-TTF)/SA(1:1))and tetrahexadecylthio-tetrathiafulvalene/stearic acid(THT-TTF/SA(1:1))are described. The thickness per layer of LB films was obtained from the results of X-ray diffraction. The X-ray diffraction pattern shows that the layer structures of TBT-TTF/SA (1:1)LB film and BEDT-TTF/SA (1:1) LB film are controlled by SA molecules. The orientation angles of TTF derivatives and SA in LB films were calculated from the results of the polarized FT-IR. The layer structures of LB films were determined according to the molecular orientation angles. The thickness per layer obtained from the molecular length and the molecular orientation angles is consistent with that from the result of X-ray diffraction.

Key words: TTF, LB film, Polarized FT-IR