Acta Phys. -Chim. Sin. ›› 2004, Vol. 20 ›› Issue (04): 396-399.doi: 10.3866/PKU.WHXB20040413
• ARTICLE •
Li Ling-Xia;Wu Xia-Wan;Wang Hong-Ru;Zhang Zhi-Ping;Yu Hao-Ming
Two high frequency dielectric systems of ZnO-B2O3-SiO2 and BaO-PbO-Nd2O3- Bi2O3-TiO2 were prepared by conventional ceramics technology. Through XRD analysis, the main crystal phases were determined. The volume percentage contents of each phase were calculated according to the X-ray diffraction peak intensity. Then, these data were introduced into Lichnetecker Law, from which the dielectric properties of the systems were obtained. This is a new way to analyze quantitative relationship between the dielectric properties and phase contents of dielectric materials.
Diffraction peak intensity
Li Ling-Xia;Wu Xia-Wan;Wang Hong-Ru;Zhang Zhi-Ping;Yu Hao-Ming. Analysis on Quantitative Relationship between Dielectric Properties and Phase Structure of High Frequency Dielectric System[J].Acta Phys. -Chim. Sin., 2004, 20(04): 396-399.
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