Acta Phys. -Chim. Sin. ›› 2011, Vol. 27 ›› Issue (12): 2915-2919.doi: 10.3866/PKU.WHXB20112915

• PHYSICAL CHEMISTRY OF MATERIALS • Previous Articles     Next Articles

Structure and Morphology of Induction-Melted Higher Manganese Silicide

ZHOU Ai-Jun1,2, CUI Heng-Guan1, LI Jing-Ze1, ZHAO Xin-Bing2   

  1. 1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China,Chengdu 610054, P. R. China;
    2. State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, P. R. China
  • Received:2011-07-01 Revised:2011-09-06 Published:2011-11-25
  • Contact: ZHOU Ai-Jun E-mail:zhouaj@uestc.edu.cn
  • Supported by:

    The project was supported by the National Natural Science Foundation of China (51102039), Fundamental Research Funds for the Central Universities, China (ZYGX2010J033), and China Postdoctoral Science Foundation (20100481375, 201104640).

Abstract: Field emission scanning microscopy (FESEM) and energy-dispersive X-ray spectroscopy (EDXS) were used to study the morphology and composition of secondary phase precipitations in induction-melted higher manganese silicide (HMS). Striations of the secondary phase were observed in individual HMS crystals with an average interval of 5-30 μm and a thickness of ~30 nm. The chemical composition of the striations was examined and found to be MnSi, which was observed as an amorphous phase by high resolution transmission electron microscopy (HRTEM). The crystal structure of HMS was determined by selective area electron diffraction (SAED) and the results indicated a single Mn4Si7 phase in the as-prepared material and no other incommensurate HMS phases were found. After ball milling and hot pressing many defects and stress fields were observed in the HMS by transmission electron microscope (TEM), which differentiated substantially from the morphology of the as-melted HMS.

Key words: Higher manganese silicide, MnSi precipitation, Amorphous, Crystal structure, defect

MSC2000: 

  • O649