Fabrication and Structure Characterization of Quasi-2-Dimensional Amorphous Carbon Structures

Acta Phys Chim Sin >> 2012,Vol.28>> Issue(07)>> 1551-1555 doi: 10.3866/PKU.WHXB201205093 中文摘要

COMMUNICATION

Previous Articles Next Articles

RAN Ke^1,2, CHEN Qing¹, ZUO Jian-Min²
1. Key Laboratory for Physics and Chemistry of Nanodevices, Department of Electronics, School of Electronics Engineering and Computer Science, Peking University, Beijing 100871;
2. Department of Material Science and Engineering, University of Illinois at Urbana-Champaign, Illinois 61801, USA

Abstract
References
Other similar articles

Download: PDF (846KB) Export: BibTeX | EndNote (RIS)

Quasi-2-dimensional total amorphous and half-amorphous carbon structures are fabricated from single-layer or few-layer of graphene via high-energy electron beam irradiation. Sample structures before and after electron beam irradiation are recorded by high resolution imaging and coherent nano-area electron diffraction using transmission electron microscopy (TEM). The atomic pair distribution functions of the sample are obtained from electron diffraction patterns. In the quasi-2-dimensional amorphous carbon material, the carbon hexagonal ring structure is not the main structural feature anymore, and the low order nearest distances between carbon atoms are slightly different from that in perfect graphene. Although the sample shows a long-range disordered atomic arrangement, it still holds short-range order and even middle-range order extending to 0.5 nm, as many zigzag carbon chains remain after electron beam irradiation.

Keywords: Graphene Quasi-2 dimensional amorphous structure Electron beam irradiation High resolution imaging Electron diffraction Atomic pair distribution function
Received: 2012-04-17 Accepted: 2012-05-08 Publication Date (Web): 2012-05-09
Corresponding Authors: CHEN Qing, ZUO Jian-Min Email: qingchen@pku.edu.cn; jianzuo@illinois.edu

Fund: The project was supported by the National Natural Science Foundation of China (60925003), Ministry of Science and Technology, China (2012CB932702), and Department of Energy, USA (DEFG02-01ER45923).

Cite this article: RAN Ke, CHEN Qing, ZUO Jian-Min. Fabrication and Structure Characterization of Quasi-2-Dimensional Amorphous Carbon Structures[J]. Acta Phys. Chim. Sin., 2012,28 (07): 1551-1555. doi: 10.3866/PKU.WHXB201205093

Service

Add to my bookshell

Add to citation manager

Authors

(1) Zachariasen,W. H. J. Am. Chem. Soc. 1932, 54, 3841. doi: 10.1021/ja01349a006
(2) Novoselov, K. S.; Geim, A. K.; Morozov, S. V.; Jiang, D.;Zhang, Y.; Dubonos, S. V.; Grigorieva, I. V.; Firsov, A. A.Science 2004, 306, 666. doi: 10.1126/science.1102896
(3) Mermin, N. D. Phys. Rev. 1968, 176, 250. doi: 10.1103/PhysRev.176.250
(4) Li, X. S.; Cai,W.W.; An, J. H.; Kim, S. Y.; Nah, J. H.; Yang, D.X.; Piner, R.; Velamakanni, A.; Jung, I.; Tutuc, E.; Banerjee, S.K.; Colombo, L.; Ruoff, R. S. Science 2009, 324, 1312. doi: 10.1126/science.1171245
(5) Hernandez, Y.; Nicolosi, V.; Lotya, M.; Blighe, F. M.; Sun, Z.Y.; De, S.; Mcgovern, I. T.; Holland, B.; Byrne, M.; Gunko, Y.K.; Boland, J. J.; Niraj, P.; Duesberg, G.; Krishnamurthy, S.;Goodhue, R.; Hutchison, J.; Scardaci, V.; Ferrari, A. C.;Coleman, J. N. Nat. Nanotechnol. 2008, 3, 563.
(6) Banhart, F.; Kotakoski, J.; Krasheninnikov, A. V. ACS Nano2011, 5, 26. doi: 10.1021/nn102598m
(7) Hashimoto, A.; Suenaga, K.; Gloter, A.; Urita, K.; Iijima, S.Nature 2004, 430, 870. doi: 10.1038/nature02817
(8) Girit, C. O.; Meyer, J. C.; Erni, R.; Rossell, M. D.; Kisielowski,C.; Yang, L.; Park, C. H.; Crommie, M. F.; Cohen, M. L.; Louie,S. G.; Zettl, A. Science 2009, 323, 1705. doi: 10.1126/science.1166999
(9) Huang, P. Y.; Ruiz-Vargas, C. S.; van der Zande, A. M.;Whitney,W. S.; Levendorf, M. P.; Kevek, J.W.; Garg, S.; Alden,J. S.; Hustedt, C. J.; Zhu, Y.; Park, J.; McEuen, P. L.; Muller, D.A. Nature 2011, 469, 389. doi: 10.1038/nature09718
(10) Lahiri, J.; Lin, Y.; Bozkurt, P.; Oleynik, I. I.; Batzill, M. Nat. Nanotechnol. 2010, 5, 326. doi: 10.1038/nnano.2010.53
(11) Ying, H.;Wang, Z. Y.; Guo, Z. D.; Shi, Z. J.; Yang, S. F. Acta Phys. -Chim. Sin. 2011, 27, 1482. [应红, 王志永, 郭政铎,施祖进, 杨上峰. 物理化学学报, 2011, 27, 1482.] doi: 10.3866/PKU.WHXB20110630
(12) Gomez-Navarro, C.; Meyer, J. C.; Sundaram, R. S.; Chuvilin,A.; Kurasch, S.; Burghard, M.; Kern, K.; Kaiser, U. Nano Lett.2010, 10, 1144. 10.1021/nl9031617
(13) Chuvilin, A.; Kaiser, U.; Bichoutskaia, E.; Besley, N. A.;Khlobystov, A. N. Nat. Chem. 2010, 2, 450. doi: 10.1038/nchem.644
(14) Ran, K.; Zuo, J. M.; Chen, Q.; Shi, Z. J. ACS Nano 2011, 4,3367.
(15) Kotakoski, J.; Krasheninnikov, A. V.; Kaiser, U.; Meyer, J. C.Phys. Rev. Lett. 2011, 106, 105505. doi: 10.1103/PhysRevLett.106.105505
(16) Warner, J. H.; Rummeli, M. H.; Ge, L.; Gemming, T.;Montanari, B.; Harrison, N. M.; Buchner, B.; Briggs, G. A. D.Nat. Nanotechnol. 2009, 4, 500. doi: 10.1038/nnano.2009.194
(17) Novoselov, K. S.; Jiang, D.; Schedin, F.; Booth, T. J.;Khotkevich, V. V.; Morozov, S. V.; Geim, A. K. Proc. Natl. Acad. Sci. U. S. A. 2005, 102, 10451. doi: 10.1073/pnas.0502848102
(18) Meyer, J. C.; Kisielowski, C.; Erni, R.; Rossell, M. D.;Crommie, M. F.; Zettl, A. Nano Lett. 2008, 8, 3582. doi: 10.1021/nl801386m
(19) Egerton, R. F.; Li, P.; Malac, M. Micron 2004, 35, 399. doi: 10.1016/j.micron.2004.02.003
(20) Krasheninnikov, A. V.; Banhart, F. Nat. Mater. 2007, 6, 723. doi: 10.1038/nmat1996
(21) Zuo, J. M.; Gao, M.; Tao, J.; Li, B. Q.; Twesten, R.; Petrov, I.Microsc. Res. Techniq. 2004, 64, 347. doi: 10.1002/jemt.20096
(22) Wen, J. G.; Mabon, J.; Lei, C. H.; Burdin, S.; Sammann, E.;Petrov, I.; Shah, A. B.; Chobpattana, V.; Zhang, J.; Ran, K.;Zuo, J. M.; Mishina, S.; Aoki, T. Microsc. Microanal. 2010, 16,183. doi: 10.1017/S1431927610000085
(23) Cockayne, D. J. H. Annu. Rev. Mater. Sci. 2007, 37, 159. doi: 10.1146/annurev.matsci.35.082803.103337
(24) Egami, T.; Billinge, J. L. Underneath the Bragg Peaks: Structural Analysis of Complex Materials; Pergamon:Amsterdam, 2003; pp 55-99.
(25) Petkov, V.; Jeong, I. K.; Chung, J. S.; Thorpe, M. F.; Kycia, S.;Billinge, S. J. L. Phys. Rev. Lett. 1999, 83, 4089. doi: 10.1103/PhysRevLett.83.4089
(26) Petkov, V.; Difrancesco, R. G.; Billinge, S. J. L.; Acharya, M.;Foley, H. C. Philos. Mag. B 1999, 79, 1519.
(27) Billinge, S. J. L.; DiFrancesco, R. G.; Kwei, G. H.; Neumeier, J.J.; Thompson, J. D. Phys. Rev. Lett. 1996, 77, 715. doi: 10.1103/PhysRevLett.77.715
(28) Jeong, I. K.; Proffen, T.; Mohiuddin-Jacobs, F.; Billinge, S. J. L.J. Phys. Chem. A 1999, 103, 921. doi: 10.1021/jp9836978
(29) Ruan, C. Y.; Murooka, Y.; Raman, R. K.; Murdick, R. A.;Worhatch, R. J.; Pell, A. Microsc. Microanal. 2009, 15, 323.doi: 10.1017/S1431927609090709
(30) Chen, H.; Zuo, J. M. Acta Materialia 2007, 5, 1617.
(31) McKenzie, D. R.; Green, D. C.; Swift, P. D. Thin Solid Films1990, 193, 418. doi: 10.1016/S0040-6090(05)80052-5
(32) Li, L.; Reich, S.; Robertson, J. Phys. Rev. B 2005, 72, 184109.doi: 10.1103/PhysRevB.72.184109