2019, Vol. 35(2): 139-144    DOI: 10.3866/PKU.WHXB201805111
Characterization of α-Cu2Se Fine Structure by Spherical-Aberration-Corrected Scanning Transmission Electron Microscope
Lu CHEN,Jun LIU,Yong WANG*(),Ze ZHANG*()
Received 2018-04-09  Revised null
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