STUDY ON THE STRUCTURE DEFECT OF ELECTRODEPOSITED TIN USING POSITRON ANNIHILATION LIFETIME SPECTROSCOPY
Yao Shi-Bing; Liu Zan-Jin; Zhou Shao-Min; Fang Jiang-Ling
Acta Phys. -Chim. Sin. . 1991, (02): 215 -218 .  DOI: 10.3866/PKU.WHXB19910217