XPS Evidence for the Diffusion and Formation of Metal Silicide at Atmospheric Temperature on the Interface of NiPd/Si
Zhang Guo-Qing,Liu Bing,Yao Su-Wei,Guo He-Tong,He Fei,Gong Zheng-Lie
Acta Phys. -Chim. Sin. . 1997, (02): 164 -168 .  DOI: 10.3866/PKU.WHXB19970212