Acta Phys. -Chim. Sin. ›› 1997, Vol. 13 ›› Issue (07): 669-672.doi: 10.3866/PKU.WHXB19970720

• Note • Previous Articles    

Observation of Nanometer-sized Structures Using a Scanning Near-field Optical Microscope(SNOM)

Tang Ming,OuYang-Min,Cai Sheng-Min,Xue Zeng-Quan,Liu Zhong-Fan   

  1. College of Chemistry and Molecular Engineering,Peking University,Beijing 100871;Department of Electronics,Peking University,Beijing 100871
  • Received:1997-01-21 Revised:1997-04-25 Published:1997-07-15
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Abstract:

A polydiacetylene nanocrystalline film has been fabricated using surface evaporation method and observed by using Aurora 2000, TopoMetrix scanning near-field optical microscope (SNOM) system. The SNOM images of this film together with the standard testing Al sample indicate that the resolution of the system is better than 80 nm 1/6 of the incident wavelength, 488 nm. The possibility of SNOM data storage using thus fabricated film is also demonstrated.

Key words: Near-field Optics, SNOM, Nanocrystalline