Acta Phys. -Chim. Sin. ›› 1996, Vol. 12 ›› Issue (10): 900-904.doi: 10.3866/PKU.WHXB19961008

• ARTICLE • Previous Articles     Next Articles

The Chemical Structure of Cr,Fe,Cu/Al2O3 Interface by XPS

Ren Hai-Lan,Liu Han-Xing,Zhang Han-Lin,Ouyang Shi-Xi,Wang Dian-fEn   

  1. Adveanced Materials Research Institute,Wuhan University of Technology,Wuhan 430070|The Center for Materials Research and Analysis,Wuhan University of Technology,Wuhan 430070
  • Received:1996-03-19 Revised:1996-06-10 Published:1996-10-15
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Abstract:

The chemical states of metal-ceramic interface were studied by XPS accompany the ion etching in situ. The results showed that Cr and Fe were both oxidized at the interfaces, and the degree of the oxidization was Cr>Fe, while Cu was not oxidized. The quantity analysis showed that the thickness of the interfaces had a direct relations with the chemical reaction.

Key words: Metal-ceramic interface, XPS, Chemical structure