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Acta Phys. -Chim. Sin.
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中文
The Semiconducting Properties of Oxide Films Formed on Chromium Studied by Capacitance Measurement
Kong De-Sheng;Li Liang
Acta Phys. -Chim. Sin. . 2004, (
06
): 631 -636 . DOI: 10.3866/PKU.WHXB20040616