qPlus型非接触原子力显微技术进展及前沿应用

刘梦溪,李世超,查泽奇,裘晓辉

Research Progress and Applications of qPlus Noncontact Atomic Force Microscopy

Meng-Xi LIU,Shi-Chao LI,Ze-Qi ZHA,Xiao-Hui QIU

图6 qPlus NC-AFM在低维纳米材料中的应用

Fig 6 Applications of qPlus NC-AFM in low dimentional nanomaterials (A, B) constant-height NC-AFM images of epitaxial graphene on Ir (111) with a metallic tip and CO tip, respectively51. (C) constant-height NC-AFM image taken with a CO tip. Intra-ribbon resolution shows the formation of 6-zigzag graphene nanoribbons (6-ZGNRs) with atomically precise CH edges. (D) constant-height NC-AFM image of edge-modified ZGNR52. (E) constant-height NC-AFM image of fused n=14 B-GNR53. (F) constant-height NC-AFM image of the junction between two 7-armchair graphene nanoribbons (7-AGNRs) and one 14-AGNR54. (G) NC-AFM image representing a single atomically resolved constant-height measurement of two-dimensional silica56