Abstract: The XPS (X-Ray Photoelectron Spectroscopy), SSIMS (Static Second Ion Mass Spectroscopy) and ISS (Ion Scattering Spectroscopy) have shown that CuCl is dis- persed on γ-Al_2O_3 surface as a monolayer. The maximum amount of dispersion of CuCl on γ-Al_2O_3 surface determined by XPS is approaching to the value determined by XRD.
The binding energy of Cu 2p3/2 obtained by XPS decreases with the amount of CuCl added to the samples. The valence band spectra of CuCl dispersed on γ-Al_2O_3 is different from that of pure CuCl. ISS of He~+ gave a scattering peak of copper of CuCl/γ-Al_2O_3 11 eV higher than that of pure CuCl. They indicate that CuCl has a quite strong interaction with the γ-Al_2O_3 surface. The dispersed CuCl gave a widening Auger peak which can be attributed to the heterogeneity of γ-Al_2O_3 surface.