物理化学学报 >> 1995, Vol. 11 >> Issue (05): 447-449.doi: 10.3866/PKU.WHXB19950513

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高分辨双晶XRF研究酞菁化合物中硫杂质的化学态

周淑琴, 余建二, 金祥凤, 王庆广   

  1. 中国科学院化学研究所|北京 100080|中国科学院生态环境研究中心|北京 100085
  • 收稿日期:1994-02-21 修回日期:1994-06-02 发布日期:1995-05-15
  • 通讯作者:

Study on Chemical State of Sulfur Impurity in Metal-free Phthalocyanine by XRF Spectrometry

Zhou Shu-Qin, Yu Jian-Er, Jin Xiang-Feng, Wang Qing-Guang   

  1. Institute of Chemistry,Chinese Academy of Sciences,Beijing 100080|Research Center for Eco-Enviromental Sciences,Chinese Academy of Sciences,Beijing 100080
  • Received:1994-02-21 Revised:1994-06-02 Published:1995-05-15
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关键词: 双晶X-射线荧光光谱(XRF), 吴金属酞菁化合物, 杂质硫的化学态

Abstract:

The chemical state of sulfur impurity in metal-free phthalocyanie has been studied by high resolution double crystal X-ray fluorescence spectrometer, in order to understand that the rare concentration of impurity sulfur plays an important role in promoting the performance of double layered photoreceptor. The results obtained by high resolution double crystal X-ray Fluorescence Spectrometry and X-ray photoelectron Spectroscopy method showed good agreements, indicating the sulfur being in the chemocal state of S4.

Key words: Double crystal XRF, Metal-free phthalocyanine, Chemical state of sulfur