物理化学学报 >> 2004, Vol. 20 >> Issue (04): 396-399.doi: 10.3866/PKU.WHXB20040413

研究论文 上一篇    下一篇

高频介质系统介电性能与相组成的定量关系分析

李玲霞;吴霞宛;王洪儒;张志萍;余昊明   

  1. 天津大学电子信息工程学院,天津　200072
  • 收稿日期:2003-10-20 修回日期:2003-12-15 发布日期:2004-04-15
  • 通讯作者: 李玲霞 E-mail:li_lingxia@eyou.com

Analysis on Quantitative Relationship between Dielectric Properties and Phase Structure of High Frequency Dielectric System

Li Ling-Xia;Wu Xia-Wan;Wang Hong-Ru;Zhang Zhi-Ping;Yu Hao-Ming   

  1. College of Electronic Information and Engineering, Tianjin University, Tianjin　200072
  • Received:2003-10-20 Revised:2003-12-15 Published:2004-04-15
  • Contact: Li Ling-Xia E-mail:li_lingxia@eyou.com

PDF

3444

赞

摘要： 采用普通电子陶瓷工艺制备两种高频介质系统ZnO-B2O3-SiO2三元系和BaO-PbO-Nd2O3-Bi2O3-TiO2五元系,通过XRD分析确定各系统的主晶相, 运用衍射峰强度计算法准确测定出各组分的体积百分含量,并代入Lichnetecker对数混合定则,计算出系统的介电性能,获得了分析介质系统介电性能与物相含量之间定量关系的新方法.

关键词: ZnO-B2O3-SiO2, BaO-PbO-Nd2O3-Bi2O3-TiO2, 衍射峰强度, 定量关系

Abstract: Two high frequency dielectric systems of ZnO-B2O3-SiO2 and BaO-PbO-Nd2O3- Bi2O3-TiO2 were prepared by conventional ceramics technology. Through XRD analysis, the main crystal phases were determined. The volume percentage contents of each phase were calculated according to the X-ray diffraction peak intensity. Then, these data were introduced into Lichnetecker Law, from which the dielectric properties of the systems were obtained. This is a new way to analyze quantitative relationship between the dielectric properties and phase contents of dielectric materials.

Key words: ZnO-B2O3-SiO2, BaO-PbO-Nd2O3-Bi2O3-TiO2, Diffraction peak intensity