物理化学学报 >> 2008, Vol. 24 >> Issue (07): 1321-1325.doi: 10.3866/PKU.WHXB20080735

研究简报 上一篇    下一篇

光漂白全过程中聚合物薄膜折射率和厚度的实时分析

肖平平   

  1. 宜春学院物理科学与工程技术学院, 江西 宜春 336000
  • 收稿日期:2008-01-14 修回日期:2008-03-12 发布日期:2008-07-04
  • 通讯作者: 肖平平 E-mail:xpp7967@163.com

Real-Time Investigation on Refractive-Index and Thickness of Polymer Films during Photobleaching Process

XIAO Ping-Ping   

  1. School of Physics Science and Engineering Technology, Yichun University, Yichun 336000, Jiangxi Province, P. R. China
  • Received:2008-01-14 Revised:2008-03-12 Published:2008-07-04
  • Contact: XIAO Ping-Ping E-mail:xpp7967@163.com

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摘要： 在基于衰减全反射原理的基础上提出一种新的测量方法, 动态研究漂白动力学过程, 即利用波导的衰减全反射吸收峰对聚合物材料的折射率和厚度敏感的特性, 实时测量聚合物材料的折射率和厚度. 实验系统采用CCD摄像头将标志波导模式的一组暗线显示在计算机屏幕上, 然后根据暗线的移动, 可以精确测量每一时刻波导薄膜的折射率和膜厚. 利用这种技术, 对聚合物薄膜的光漂白过程进行了实时监控. 发现在光漂白全过程中, 聚合物薄膜的折射率和厚度的变化同时存在化学和物理两种变化过程.

关键词: 衰减全反射, 聚合物波导, 光漂白

Abstract: A novel real-time measurement method to determine the refractive index and the thickness of a polymer film during photobleaching process was proposed based on the non-scanning attenuated total reflection (ATR) technique. Several dark lines corresponding to the guided-wave modes were demonstrated on the computer screen by a CCD camera. According to the shift of the dark lines, the changing values of refractive index and thickness of the polymer film can be simultaneously determined in time during photobleaching process. And we found that both chemical and physical change processes existed in the changes of refractive index and thickness of the polymer.

Key words: Attenuated total reflection, Polymer waveguide, Photobleaching