多种类表面活性剂临界胶束浓度定量构效关系

doi:10.3866/PKU.WHXB201210265

Abstract

Abstract:

Critical micelle concentration (CMC) is one of the most useful parameters for the characterization of surfactants; thus, CMC plays an important role in the investigation of the surfactants? properties for industrial applications and biological utilizations. The following study presents a stable and accurate structure-property relationship model for the prediction of CMC for a diverse set of 175 surfactants using a new topological index, the extended distance matrix. Research indicates that the new model based on this topological index is very efficient and provides satisfactory results. The high-quality prediction model is evidenced by an R² (square correlation coefficient) value of 0.9295 and an average relative difference (ARD) value of 8.20% for the training set, an R² value of 0.9257 and an ARD value of 6.76% for the testing set. Comparison results with reference models demonstrate that this new method based on the topological index results in significant improvements, both in accuracy and stability for predicting CMC of surfactants.

Key words: Surfactant, Critical micelle concentration, Structure-property relationship, Topological index, Prediction

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ZHU Zhi-Chen, WANG Qiang, JIA Qing-Zhu, TANG Hong-Mei, MA Pei-Sheng. Quantitative Structure-Property Relationship of the Critical Micelle Concentration of Different Classes of Surfactants[J].Acta Phys. -Chim. Sin., 2013, 29(01): 30-34.

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Quantitative Structure-Property Relationship of the Critical Micelle Concentration of Different Classes of Surfactants

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