Acta Phys. -Chim. Sin. ›› 1999, Vol. 15 ›› Issue (05): 403-406.doi: 10.3866/PKU.WHXB19990504

• ARTICLE • Previous Articles     Next Articles

Fractal Characteristics of Film Surface

Tang Xiao-Ming, Wei Sai-Zhen, Mao Zu-Sui, Li Hai-Yang, Chen Xiao-Feng, Zheng Yong-Ming   

  1. Physics Department,Zhejiang University,Hangzhou 310027|Plasma Physics Laboratory of High Temperature and High Density,Chengdu 610003
  • Received:1998-08-05 Revised:1998-09-24 Published:1999-05-15
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Abstract:

A fractal surface was generated on computer by random addition method. The simulated measurement on this surface shows that z resolution has little effect on calculating fractal dimension D while the lower x y resolution causes larger statistic error. D was calculated for Au films on three kind of substfate using data from Scanning Tunneling Microscope(STM) images. D = 2. 15 for Au/ceramic, and D = 2. 06 for Au/optical glass. D has different values for different points on Au/general glass, the reason of mismatch between curves from STM images of different scan sizes was also discussed.

Key words: Fractal dimension, Film surface, STM, Computer simultion, Resolution