Acta Phys. -Chim. Sin. ›› 1998, Vol. 14 ›› Issue (04): 293-298.doi: 10.3866/PKU.WHXB19980402

• ARTICLE • Previous Articles     Next Articles

AFM Studies of HTDIOO Monomolecular Layer LB Films

Tian Fang, Wang Chen, Bai Chun-Li, Xu Yu   

  1. Institute of Chemistry,The Chinese Academy of Sciences,Beijing 100080
  • Received:1997-07-07 Revised:1997-09-16 Published:1998-04-15
  • Contact: Bai Chun-Li


The structures of HTDIOO molecular monolayer and multilayer LB films have been observed by atomic force microscopy (AFM) in molecular and nanometer scales. It demonstrates that large AFM probe tip force could damage the structure of HTDIOO LB films. Moreover, there is an ordered structure in HTDIOO monolayer LB film. While the HTDIOO molecules aggragate and form domains in multilayer LB film, which could be associated with the stripe magnetic sturcture formed in multilayer HTDIOO LB films observed with magnetic force microscopy(MFM).

Key words: Atomic force microscopy, LB film